|제목||[학술세미나] [학과세미나] 11월 28일(목) 학과세미나 안내|
|내용||[학과세미나] 11월 28일(목) 학과세미나 안내
▪제목 : The Semiconductor Manufacturing Data Analysis via Oversampling and XGBoost
▪연사 : 박민준 (서울대학교 통계학과)
▪일시 : 2019년 11월 28일(목) PM 17:00 – 19:00
▪장소 : 25동 210호
The objective of this research project is to examine the relation between defective rates and features that are measured during the semiconductor manufacturing process, and moreover, to predict a future defective rate. To do this, the prediction of extreme values is the most important issue. Therefore, we propose a proper method of analyzing such data via oversampling and eXtreme Gradient Boosting (XGBoost).
세미나 안내_191128_박민준.hwp [12KB]